The AMI evaluation system continuously measures leakage current to evaluate electrochemical migration and insulation resistance degradation in electronic components. It supports long-term reliability and lifetime testing for increasingly demanding applications such as AI servers and other high-performance electronics. Can be integrated with ESPEC temperature/humidity chambers.
NEW: AMI-SPM enables leakage current and resistance change measurements in low-voltage regions below 10V, suitable for advanced packages that operate at lower voltages.
Specification Summary (Applied Voltage range: 1 to 100V)
Resistance measurement range (Ω)
2.0×105 to 1.0×1013(when 100 V is applied)
2.0×103 to 1.0×1011(when 1 V is applied)
Channel configuration
25 to 300 ch per rack
Channel control
5ch
25ch
Measurement voltage
DC1.0 to 100V (0.1V increments)
Leakage current detection speed
Constant detection at less than 100 µsec
Features for AMI Electrochemical Migration Evaluation Systems
Stress voltage options from 100 V to 2500 V
The AMI system supports insulation reliability testing across a wide range of voltage conditions. Available constant stress voltage options include 100 V, 300 V, 500 V, 1000 V, and 2500 V. Contact ESPEC for requirements above 2500 V.
Individual event detection for every channel
Dedicated event detectors monitor each measurement channel independently. When resistance drops below a predefined threshold, the system automatically begins recording measurement data at the specified interval.
Easy cable connection and maintenance
An optional connection unit simplifies measurement cable installation and removal, reducing setup time when connecting or soldering specimens. The unit can be installed on the front, left, or right side of the rack to accommodate the installation environment.
Measurement cable for 5-channel connectors.
Monitor up to four environmental test chambers
Up to four environmental test chambers can be connected to the AMI system through Ethernet. Along with resistance and voltage measurements, chamber temperature and humidity can be monitored from the AMI system and recorded with the test results.
Example connection to a benchtop temperature and humidity chamber.
Optional connecting jig
Optional connecting jigs are available to accommodate different specimen types and simplify specimen-to-cable connections for more efficient test setup.